Fit, failure, and the hall of fame : how companies succeed or fail / Raymond E. Miles, Charles C. Snow.

By: Contributor(s): Material type: TextTextCopyright date: New York : Toronto : New York : Free Press ; Maxwell Macmillan Canada ; Maxwell Macmillan International, ©1994Description: 215 páginas. : ilustraciones ; 25 cmISBN:
  • 0029212650
Subject(s): DDC classification:
  • 658 M593
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Item type Current library Collection Call number Copy number Status Date due Barcode
Libro Libro Biblioteca QLU Colección general Colección General 658 M593 (Browse shelf(Opens below)) e.1 Available 2022-1233

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