Fit, failure, and the hall of fame : how companies succeed or fail / Raymond E. Miles, Charles C. Snow.
Material type: TextCopyright date: New York : Toronto : New York : Free Press ; Maxwell Macmillan Canada ; Maxwell Macmillan International, ©1994Description: 215 páginas. : ilustraciones ; 25 cmISBN:- 0029212650
- 658 M593
Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode |
---|---|---|---|---|---|---|---|
Libro | Biblioteca QLU Colección general | Colección General | 658 M593 (Browse shelf(Opens below)) | e.1 | Available | 2022-1233 |
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